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Norma o proyecto bajo la responsabilidad directa de ISO/TC 202/SC 3 Secretaría | Etapa | ICS |
---|---|---|
Microbeam analysis — Analytical electron microscopy — Guidelines of specimen preparation for transmission electron microscope using focused ion beam processing |
20.20 |
|
Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy |
90.92 | |
Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wire-like crystals by transmission electron microscopy |
50.00 | |
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials |
90.92 | |
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials |
40.60 | |
Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis |
60.60 | |
Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy |
60.60 | |
Microbeam analysis — Analytical electron microscopy — Selected-area electron diffraction analysis using a transmission electron microscope |
95.99 | |
Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope |
90.92 | |
Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope |
40.20 | |
Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures |
95.99 | |
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures |
95.99 | |
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures |
60.60 |
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