ISO 18117:2009

Retirada (Edición 1, 2009)

Nueva versión disponible: ISO 20579-1:2024

Resumen

ISO 18117:2009 gives guidance on the handling of and the containers for specimens submitted for surface chemical analysis. It is intended for the user of surface analysis services as an aid in understanding the special sample handling requirements of surface chemical analysis techniques, particularly the following: Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS or ESCA). The protocols presented may also be applicable to other analytical techniques, such as TXRF, that are sensitive to surface composition. In particular instances, with particular specimens, further precautions may be necessary.

Informaciones generales

Estado
: Retirada

Fecha de publicación
: 2009-03

Versión corregida (en)
: 2009-06

Versión corregida (fr)
: 2009-06

Etapa
: Retirada de la Norma Internacional [95.99]
Edición
: 1

Número de páginas
: 9
Comité Técnico :
ISO/TC 201/SC 2

ICS :
71.040.40
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