Resumen
ISO 11505:2013 describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films.
It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined.
Informaciones generales
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Estado: PublicadoFecha de publicación: 2012-12Etapa: Norma Internacional para revisar [90.92]
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Edición: 1Número de páginas: 33
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Comité Técnico :ISO/TC 201/SC 8ICS :71.040.40
- RSS actualizaciones
Próxima versión en desarrollo
ISO/DIS 11505
Surface chemical analysis — General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
Ciclo de vida
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Ahora
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Será reemplazada por
En desarrolloISO/DIS 11505