Resumen
This document presents a list of common practices in preparation methods of metallographic specimens for optical and scanning electron microscopy, including preliminary preparation, grinding and polishing of specimens as well as microstructure revelation methods covering the optical method, etching methods (chemical, electrolytic, constant potential, ion sputtering and high temperature relieving) and the interface layer method [1][2].
Informaciones generales
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Estado: PublicadoFecha de publicación: 2022-07Etapa: Norma Internacional publicada [60.60]
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Edición: 1Número de páginas: 17
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Comité Técnico :ISO/TC 17/SC 7ICS :77.080.20
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