ISO/CD 16524
Surface chemical analysis — Atomic force microscopy — Guideline for quantitative nanoscale potential measurement by Kelvin probe force microscopy
Reference number
ISO/CD 16524
Edición 1
ISO/CD 16524
El comité está revisando un borrador.


This document describes the standard procedures for the quantitative use of Kelvin probe force microscopy (KPFM). It includes reproducible measurements of contact potential differences (CPD), reliable deduction of the work function of the KPFM probe-tip in use, and quantitative evaluation of the lateral resolutions of CPD imaging with KPFM. This document is applicable to the quantitative analysis of KPFM surface potential imaging of solid material surfaces at the nanoscale.

Informaciones generales

  •  : Eliminado
    : Proyecto cancelado [30.98]
  •  : 1
  • ISO/TC 201/SC 9
  • RSS actualizaciones

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)