Résumé
PreviewISO 18554:2016 provides a simple procedure for identifying, estimating and correcting for unintended degradation in the elemental composition or chemical state of a material which occurs as a result of X-radiation during the time that a specimen material is exposed to the X-rays used in X-ray photoelectron spectroscopy (XPS).
ISO 18554:2016 does not address comparisons between different types of material nor does it address the mechanisms, depth, or chemical nature of the degradation that occurs. The correction procedure proposed is only valid if the changes are caused by the X-rays and result in less than a 30 % reduction or increase in intensity of a chosen photoelectron peak from the sample material.
-
État actuel: PubliéeDate de publication: 2016-03
-
Edition: 1
-
- ICS :
- 71.040.40 Méthodes d'analyse chimique
Acheter cette norme
| Format | Langue | |
|---|---|---|
| std 1 92 | ||
| std 2 92 | Papier |
- CHF92
Cycle de vie
Vous avez une question?
Consulter notre FAQ
Horaires d’ouverture:
De lundi à vendredi - 09:00-12:00, 14:00-17:00 (UTC+1)
Suivez l'actualité de l'ISO
Inscrivez-vous à notre Newsletter (en anglais) pour suivre nos actualités, points de vue et informations sur nos produits.