ISO 14571:2020

недоступно на русском языке

Текущий статус : Опубликовано

	Формат	Язык
std 1 61	PDF + ePub
std 2 61	Бумажный

CHF61

Пересчитать швейцарские франки (CHF) в ваша валюта

Тезис

This document specifies a method for non-destructive measurements of the thickness of conductive coatings on non-conductive base materials. This method is based on the principle of the sheet resistivity measurement and is applicable to any conductive coatings and layers of metal and semiconductor materials. In general, the probe has to be adjusted to the conductivity and the thickness of the respective application. However, this document focuses on metallic coatings on non-conductive base materials (e.g. copper on plastic substrates, printed circuit boards).

This method is also applicable to thickness measurements of conductive coatings on conductive base materials, if the resistivity of the coating and the base material is significantly different. However, this case is not considered in this document.

Общая информация

Текущий статус
: Опубликовано

Дата публикации
: 2020-11

Этап
: Опубликование международного стандарта [60.60]
Версия
: 1
Технический комитет :
ISO/TC 107

ICS :
25.220.40
RSS обновления