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Standard and/or project under the direct responsibility of ISO/TC 201/SC 9 Secretariat | Stage | ICS |
---|---|---|
Surface chemical analysis--Scanning probe microscopy--Guidelines for the method and procedure for determining the effect of temperature on AFM nano-scale dimension measurements
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30.60 |
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Surface chemical analysis — Scanning-probe microscopy — Measurement of drift rate
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90.93 | |
Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
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90.93 | |
Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
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95.99 | |
Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
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90.93 | |
Surface chemical analysis — Scanning probe microscopy — Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
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90.93 | |
Surface Chemical Analysis — Atomic force microscopy — Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
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90.93 | |
Guideline to describe AFM probe properties
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10.99 |
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Surface chemical analysis — Atomic force microscopy — Guideline for quantitative nanoscale potential measurement by Kelvin probe force microscopy
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30.98 |
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Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
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60.60 | |
Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
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20.99 | |
Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
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60.60 | |
Surface chemical analysis — Scanning-probe microscopy — Definition and calibration of the lateral resolution of a near-field optical microscope
|
90.60 |
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