Abstract
ISO 18116:2005 gives guidance on methods of mounting and surface treatment for a specimen about to undergo surface chemical analysis. It is intended for the analyst as an aid in understanding the specialized specimen-handling conditions required for analyses by techniques such as Auger electron spectroscopy, secondary-ion mass spectrometry, and X-ray photoelectron spectroscopy.
General information
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Status: PublishedPublication date: 2005-08Stage: International Standard to be revised [90.92]
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Edition: 1Number of pages: 16
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Technical Committee :ISO/TC 201/SC 2ICS :71.040.40
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ISO/DIS 20579-2
Surface chemical analysis — Sample handling, preparation and mounting
Part 2: Documenting and reporting the preparation and mounting of specimens for analysis
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Under developmentISO/DIS 20579-2