International Standard
ISO 18452:2005
Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer
Reference number
ISO 18452:2005
Edition 1
2005-11
© ISO 2024
International Standard
Read sample
Published (Edition 1, 2005)
This standard was last reviewed and confirmed in 2019. Therefore this version remains current.

ISO 18452:2005

Format
Language
CHF 63
Convert Swiss francs (CHF) to your currency

Abstract

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

General information

  • Status
     : Published
    Publication date
     : 2005-11
    Stage
    : International Standard confirmed [90.93]
  • Edition
     : 1
    Number of pages
     : 9
  • Technical Committee :
    ISO/TC 206
    ICS :
    81.060.30 
  • RSS updates

Life cycle

Sustainable Development Goals

This standard contributes to the following Sustainable Development Goal

9
Industry, Innovation and Infrastructure

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)

  2. Store
  3. Standards catalogue
  4. ICS
  5. 81
  6. 81.060
  7. 81.060.30
  8. ISO 18452:2005