International Standard
ISO 22493:2014
Microbeam analysis — Scanning electron microscopy — Vocabulary
Reference number
ISO 22493:2014
Edition 2
2014-04
© ISO 2024
International Standard
Read sample
Published (Edition 2, 2014)

ISO 22493:2014

Format
Language
CHF 129
Convert Swiss francs (CHF) to your currency

Abstract

ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.

ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

General information

  • Status
     : Published
    Publication date
     : 2014-04
    Stage
    : Close of review [90.60]
  • Edition
     : 2
    Number of pages
     : 20
  • Technical Committee :
    ISO/TC 202/SC 1
    ICS :
    37.020  01.040.37 
  • RSS updates

Life cycle

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)

  2. Store
  3. Standards catalogue
  4. TC
  5. ISO/TC 202/SC 1
  6. ISO 22493:2014