Abstract
ISO 15470:2017 describes the way in which specific aspects of the performance of an X-ray photoelectron spectrometer are described.
General information
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Status: PublishedPublication date: 2017-03Stage: International Standard confirmed [90.93]
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Edition: 2Number of pages: 5
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Technical Committee :ISO/TC 201/SC 7ICS :71.040.40
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Life cycle
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Previously
WithdrawnISO 15470:2004
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Now